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Experimental Facilities in Physics and Material Science & Engineering
Rozcestník experimentálního vybavení pro fyziku a materiálové vědy

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1. Characterisation and Testing

1.1. Surface Characterisation
1.2. Electron Microscopy
1.3. X-ray Facilities
1.4. AFM & SPM
1.5. Spectroscopy
1.6. Physical Property (Bulk)
1.7. Lasers
1.8. Sample Preparation
1.9. Other

2. Materials
& Technologies

2.1. Alloy casting
2.2. Crystal growth
2.3. Nanomaterials
2.4. Semiconductors
2.5. Thin films and coatings
2.6. Materials Processing
2.7. Other

3. Workshops

4. Services

4.1. Computing services
4.2. Research services
4.3. Support services
4.4. Other

5. Software

5.1. CAD Software
5.2. Databases general
5.3. FEM software
5.4. Material databases
5.5. Material science
5.6. Mathematics
5.7. Measurement&control
5.8. Project management
5.9. Simulations general
5.10. Theoretical Physics
5.11. Other

Optical microscope Zeiss Axio Imager Z1m with Nomarski interference contrast

Zeiss Axio Imager Z1.m is top level optical microscope, which allows for all kinds of optical microscopy tasks including observations in polarized light, Nomarski contrast and dark field.

Category:

  • Surface Characterisation
Number: 
4
Section: 
2
Department: 
18
Contact person: 
Jaromír Kopeček
Phone number: 
266052899
E-mail: 
kopecek@fzu.cz
Room: 
S238
Website: 
Zeiss Axio Imager Z1.m
Laboratory: 
Centre for Analysis of Functional Materials

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