Physical Property (Bulk)

1.6.1. VSM Magnetometer Cryogenics

The Cryogenic Vibrating Sample Magnetometer (VSM) is designed for measurement of the DC magnetic moment of a sample with a noise floor sensitivity of 10-6 and at 10 seconds integration time. The standard temperature range is 1.6 K to 400 K.  The system has been upgraded to include measurements of electrical resistivity.

Contact: Oleg Heczko / 266052714 / heczko@fzu.cz
1.6.2. Servohydraulic deformation machine INSTRON 8872 with thermal chamber

Deformation machine for dynamic and static uniaxial testing with loading capacity up to 25 kN. A thermal chamber is available for themomechanical testing in the temperature range -100°C – 550°C. Several types of grips  for tensile and compressive testing are available. The machine may be coupled with Mercury videoextensometer allowing for optical 2D and 1D displacement and strain measurements based on Digital Image Correlation.

Contact: Ludek Heller / 266052428 / heller@fzu.cz
1.6.3. Physical Properties Measurement System - PPMS 9

Physical Property Measurment System enabling measurements of magnetization/a.c. susceptibility, transport properties, specific heat, dilatometry and Raman spectroscopy in temperature range 0.35 - 400 K  (magnetization up to 1000 K) up to 9 T

Contact: Josef Šebek / 221 912 736 / sebek@fzu.cz
1.6.4. Physical Properties Measurement System - PPMS 14

Physical Property Measurment System enabling measurements of magnetization/a.c. susceptibility, transport properties, specific heat, dilatometry and Raman spectroscopy in temperature range 0.35 - 400 K (magnetization up to 1000 K) up to 14 T

Contact: Josef Šebek / 221 912 736 / sebek@fzu.cz
1.6.5. Impedance Analyzer Agilent 4291B

Coaxial measurements of complex impedance of bulk samples, 1 MHz - 1.8 GHz , 100-500 K. Electrodynamic calculation of complex permittivity (rod-like samples with electrodes) or permeability (rings)

Contact: M. Kempa / 2 6605 2618 / kempa@fzu.cz
1.6.6. Vector Network Analyzer Agilent PNA 8364 with close-cycle cryostat

Microwave resonance measurements (10 - 400 K) of complex permittivity in the shielding cavity at one frequency between 2 and 17 GHz; plate-like bulk samples and films on substrates

Contact: M. Kempa / 2 6605 2618 / kempa@fzu.cz
1.6.7. Vector Network Analyzer Agilent PNA 8364 with open-end coaxial probe

Room-temperature measurements of complex permittivity / conductivity of liquids, soft matter and plate-like samples; 200 MHz - 20 GHz, or 500 MHz - 50 GHz in case of liquids

Contact: M. Kempa / 2 6605 2618 / kempa@fzu.cz
1.6.8. Dielectric analyzer Alpha_AN (Novocontrol)

Complex permittivity/conductivity measurements. Frequency range 3x10^-6Hz–20 MHz, 10–900K

Contact: M. Savinov / 2 6605 2641 / savinov@fzu.cz
1.6.9. Impedance analyzer HEWLETT-PACKARD 4192A

Complex permittivity/conductivity measurements. Frequency range 100 Hz – 5 MHz, 10 – 900 K

Contact: M. Savinov / 2 6605 2641 / savinov@fzu.cz
1.6.10. Fourier spectrometer BRUKER IFS113v

Spectral range 15-10.000 cm–1, temperature range 5 – 950 K, transmission and specular reflection measurements

Contact: S. Kamba / 2 6605 2957 / kamba@fzu.cz
1.6.11. Micro-Raman spectrometer RM 1000 (RENISHAW)

Multichannel detection, temperature range 10 – 1450 K, polarizing microscope (excitation @ 514 or 633 nm).

Contact: I. Gregora / 2 6605 2654 / gregora@fzu.cz
1.6.12. In-Via Reflex Raman Microscope (RENISHAW) combined with NTEGRA Spectra AFM Upright Microscope (NT-MDT)

Optical AFM head – for Raman and AFM mapping (excitation @ 488 or 325 nm)

Contact: I. Gregora / 2 6605 2654 / gregora@fzu.cz
1.6.13. PerkinElmer Pyris Diamond differential scanning calorimeter

The calorimeter has a temperature range 210 – 900 K. The optimum mass of the samples is a few tens of mg but it could be lower. The RMS noise is ~1 mW.

Contact: P. Vaněk / 2 6605 2909 / vanek@fzu.cz
1.6.14. Custom-made terahertz spectrometer

(1) Spectrometer seeded by a femtosecond laser oscillator MIRA: for measurement of steady-state optical, dielectric and transport properties of solid and liquid samples in the range 0.1 - 3 THz.
(2) A setup powered by femtosecond laser amplifier SPITFIRE (1 mJ/pulse, 5 kHz repetition rate); optical pump - THz probe measurements of solids and liquids (0.2 - 2.5 THz); optical excitation using harmonic wavelengths (800 nm, 400 nm, 266 nm) or optical parametric amplifier (240 - 3000 nm)
Both spectrometers can be complemented by a cryostat or a furnace to cover temperatures 10 - 900 K.

Contact: P. Kužel / 2 6605 2176 / kuzelp@fzu.cz
1.6.15. Custom-made terahertz spectrometer

Spectrometer seeded by a femtosecond laser oscillator VITESSE is used for measurements in magnetic field (0 - 7 T, 2 - 300 K, 0.2 - 2.5 THz).

Contact: P. Kužel / 2 6605 2176 / kuzelp@fzu.cz
1.6.16. Magnetic Property Measurement System - QD-MPMS-XL-7

Magnetic Property Measurement System - QD-MPMS-XL-7 is designed for precise measurement of magnetic response.

  1. Field Range: ± 7 Tesla  - High Uniformity Magnet (0,01 %)
  2. DC Measuring mode – sensitivity < < 1 x 10-7 emu
  3. RSO Measuring Mode - sensitivity < < 1 x 10-8 emu
  4. Continuous Low Temperature Control and Temperature Sweep Mode
  5. Transverse Moment Detection System Dynamic Range: 10-6 to -> 1.5 emu
  6. Vertical Sample Rotator Range: ± 360 degrees Resolution: ± 0,5 degrees
  7. Sample Space Oven, Tube Inner Diameter: 3,5 mm, Temperature Range:300to 800 Kelvin (± 0,5 %)
  8. Magnet Reset for 7 Tesla Magnet, outer Nitrogen jacket
Contact: Zdeněk Arnold / +420220318426 / arnold@fzu.cz
1.6.17. EPR Spectrometer E580 Bruker ELEXSYS

The EPR laboratory is equipped by spectrometer Bruker E580 ELEXSYS, designed to measure electron paramagnetic (spin) resonance in both modes - continuous wave (CW) and pulsed (FT), both in the most common X-band (9,4-9 8 GHz) and in Q-band (34 GHz) frequencies. In both frequency ranges spectrometer comprises a system for measuring ENDOR (electron nuclear double resonance) and ELDOR (electron-electron double resonance). The spectrometer is equipped with the cryostat allowing measurements in the range 1.8-300 K. The light excitation of samples can be performed with an optical cryostat system allows using various types of lamps or OPO laser generating ns pulses at wavelength interval 210-2700 nm.

Contact: Ján Lančok / 420266052645 / lancok@fzu.cz