Surface Characterisation

1.1.1. VIC-3D - Digital Image Correlation system

Vic-3D provides surface full-field, 3-Dimensional measurements of shape, displacement and strain, based on the principle of Digital Image Correlation. The system consists of two synchronized cameras, calibration targets, and data acquisition and post-processing software.

Contact: L. Heller / 266052428 /
1.1.2. Digital optical microscope Keyence VHX-1000

Keyence VHX-1000 is digital optical microscope with depth of field at least 20 times larger than optical microscopes. Because of this, the VHX-1000 can accurately observe the surface topography of a target with large peaks and valleys; imaging that is typically impossible for conventional optical microscopes to achieve.

Contact: J. Kopecek / 266052899 /
1.1.3. Mercury - Digital Image Correlation based videoextensometer

Mercury provides surface 2D and 1D displacement and strain  measurements based on Digital Image Correlation. The system allows applying multiple virtual probes (Movement Sensors) on markers and advanced image features to be tracked, including the natural pattern of the sample surfaces. The system consists of two synchronized cameras, calibration targets, and data acquisition and post-processing software.

Contact: Ludek Heller / 266052428 /
1.1.4. Optical microscope Zeiss Axio Imager Z1m with Nomarski interference contrast

Zeiss Axio Imager Z1.m is top level optical microscope, which allows for all kinds of optical microscopy tasks including observations in polarized light, Nomarski contrast and dark field.

Contact: Jaromír Kopeček / 266052899 /
1.1.5. System for electrochemical testing GAMRY Reference 600

The Reference 600 is a high-performance, research-grade potentiostat/galvanostat/ZRA with on-board electronics for electrochemical impedance spectroscopy measurements over a frequency range of 1 MHz down to 10 microHz. It is particularly suitable for applications in physical electrochemistry, sensors, coatings, and corrosion.

Contact: Jan Racek / 266052361 /
1.1.6. NanoESCA

NanoESCA is a sophisticated analytical instrument designed for imaging and small spot photoemission spectroscopy (XPS) with photoemission electron microscopy (PEEM). Excitation sources range from a high-power monochromatic Al Kα( x-ray) source to UV sources such as He-, Mercury arc- and Deuterium lamps allow to work in three regimes: ●PEEM microscope, ● classical ESCA mode and ●2D imaging ESCA and PEEM modes. PEEM images a surface of a sample with lateral resolution <50 nm and with X-ray source better than 500 nm and energy resolution approx. 0.3 eV. The optical column provides 2D cuts of momentum distribution of photoexcited electrons (ARPES) with energy resolution approx. 0.1 eV

Contact: Ján Lančok / 266052645 /