NanoESCA is a sophisticated analytical instrument designed for imaging and small spot photoemission spectroscopy (XPS) with photoemission electron microscopy (PEEM). Excitation sources range from a high-power monochromatic Al Kα( x-ray) source to UV sources such as He-, Mercury arc- and Deuterium lamps allow to work in three regimes: ●PEEM microscope, ● classical ESCA mode and ●2D imaging ESCA and PEEM modes. PEEM images a surface of a sample with lateral resolution <50 nm and with X-ray source better than 500 nm and energy resolution approx. 0.3 eV. The optical column provides 2D cuts of momentum distribution of photoexcited electrons (ARPES) with energy resolution approx. 0.1 eV

Contact person: 
Ján Lančok
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