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Experimental Facilities in Physics and Material Science & Engineering
Rozcestník experimentálního vybavení pro fyziku a materiálové vědy

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1. Characterisation and Testing

1.1. Surface Characterisation
1.2. Electron Microscopy
1.3. X-ray Facilities
1.4. AFM & SPM
1.5. Spectroscopy
1.6. Physical Property (Bulk)
1.7. Lasers
1.8. Sample Preparation
1.9. Other

2. Materials
& Technologies

2.1. Alloy casting
2.2. Crystal growth
2.3. Nanomaterials
2.4. Semiconductors
2.5. Thin films and coatings
2.6. Materials Processing
2.7. Other

3. Workshops

4. Services

4.1. Computing services
4.2. Research services
4.3. Support services
4.4. Other

5. Software

5.1. CAD Software
5.2. Databases general
5.3. FEM software
5.4. Material databases
5.5. Material science
5.6. Mathematics
5.7. Measurement&control
5.8. Project management
5.9. Simulations general
5.10. Theoretical Physics
5.11. Other

Scanning electron microscope TESCAN FERA3 with Xe-FIB

Tescan FERA 3 SEM is a scanning electron microscope combined with novel Xenon plasma focused ion beam and wide set of detectors and analyzers including EDS, EDSD, CL, EBIC and 3D option for mappping. It allows majority of the tasks for SEM.

Category:

  • Electron Microscopy
Number: 
1
Section: 
2
Department: 
18
Contact person: 
Jaromír Kopeček
Phone number: 
266052899
E-mail: 
kopecek@fzu.cz
Room: 
S239
Website: 
Tescan FERA 3 SEM
Laboratory: 
Centre for Analysis of Functional Materials

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