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Rozcestník experimentálního vybavení pro fyziku a materiálové vědy

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1. Characterisation and Testing

1.1. Surface Characterisation
1.2. Electron Microscopy
1.3. X-ray Facilities
1.4. AFM & SPM
1.5. Spectroscopy
1.6. Physical Property (Bulk)
1.7. Lasers
1.8. Sample Preparation
1.9. Other

2. Materials
& Technologies

2.1. Alloy casting
2.2. Crystal growth
2.3. Nanomaterials
2.4. Semiconductors
2.5. Thin films and coatings
2.6. Materials Processing
2.7. Other

3. Workshops

4. Services

4.1. Computing services
4.2. Research services
4.3. Support services
4.4. Other

5. Software

5.1. CAD Software
5.2. Databases general
5.3. FEM software
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5.5. Material science
5.6. Mathematics
5.7. Measurement&control
5.8. Project management
5.9. Simulations general
5.10. Theoretical Physics
5.11. Other

Vector Network Analyzer Agilent PNA 8364 with close-cycle cryostat

Microwave resonance measurements (10 - 400 K) of complex permittivity in the shielding cavity at one frequency between 2 and 17 GHz; plate-like bulk samples and films on substrates

Category:

  • Physical Property (Bulk)
Number: 
6
Section: 
2
Department: 
12
Contact person: 
M. Kempa
Phone number: 
2 6605 2618
E-mail: 
kempa@fzu.cz
Room: 
Slovanka 127
Website: 
http://www.keysight.com/main/redirector.jspx?action=obs&nid=536882573.3.00&lc=en…

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