AFM Bruker Dimension ICON

AFM Dimension Icon microscope performs all major SPM imaging techniques including ScanAsyst,Contact Mode, Tapping Mode, PeakForce Tapping, TappingMode & PhaseImaging, PeakForce QNM, LiftMode, MFM, Force spectroscopy, Piezoresponce microscopy, Kelvin Probe etc. The instruments provides sample heating and temperature control from -35°C to 250 °C for samples in air or in other inert gasses. The measurements could be performed in air, controlable atmosphere or liquids. The electrochemistry accessory is also available.
 

Category:

Number: 
4
Section: 
Optics
Department: 
Analyses of Functional Materials
Contact person: 
Ladislav Fekete
Phone number: 
266052430
E-mail: 
Room: 
134