Laboratory ROTAN

Structures of polycrystalline, nanocrystalline or amorphous materials as well as single crystals of the large variety of materials are characterised in this laboratory  by X-ray diffraction.  The laboratory is equipped by X-ray generators with rotating anode and conventional sources. Depending of the equipment used measurement temperature can reached from -100°C to 2000°C. Large variety of methods used include qualitative and quantitative X-ray phase analysis, lattice parameter, grain size and microdeformation determination, macroscopic stress measurement, basic texture analysis, crystalline phase rate specification for polycrystalline materials, and for single crystals in particular crystal orientation determination, X-ray reflectometry, and high resolution X-ray diffraction.