Rozcestník experimentálního vybavení pro fyziku a materiálové vědy
Scanning electron microscope FEI Quanta3D with focus ion beam
High resolution scanning electron microscope (FESEM) combined with focus ion beam (FIB) FEI Quanta 3D FEG and extensive accessories (EDS, EBSD, GIS, etc.) is fully equipped workstation for 2D and 3D microscopy, nanomachining and MEMS prototyping.
Category:
Number:
2
Section:
2
Department:
17
Contact person:
Mariana Klementova
Phone number:
266052612
E-mail:
Room:
S245
Website:
Laboratory: