NT-NTEGRA Prima is a high-resolution, low-noise scanning probe microscope allowing vizualization of surface structures on a scale up to 100 microns x 100 microns.
Rozcestník experimentálního vybavení pro fyziku a materiálové vědy
AFM & SPM
1.4.1. Scanning Probe Microscope NT-MDT NTEGRA Prima
Contact: Ladislav Fekete / 266052746 / fekete@fzu.cz
1.4.2. AFM microscope Dimension 3100
Atomic force microscope with position control and advanced regimes for correlated measurements of high-resolution nanoscale morphology, phase, (opto) electronic properties, and electronic transport.
Contact: Antonin Fejfar / 220 318 501 / fejfar@fzu.cz
1.4.3. Raman-AFM microspectrometer Renishaw InVia
Raman micro-spectrometer including UV, blue and NIR lasers and combined with AFM system including all advanced regimes ((photo)current, Kelvin probe, phase, force curves, etc.).
Contact: Antonin Fejfar / 220 318 501 / fejfar@fzu.cz
1.4.4. AFM Bruker Dimension ICON
AFM Dimension Icon microscope performs all major SPM imaging techniques including ScanAsyst,Contact Mode, Tapping Mode, PeakForce Tapping, TappingMode & PhaseImaging, PeakForce QNM, LiftMode, MFM, Force spectroscopy, Piezoresponce microscopy, Kelvin Probe etc. The instruments provides sample heating and temperature control from -35°C to 250 °C for samples in air or in other inert gasses. The measurements could be performed in air, controlable atmosphere or liquids. The electrochemistry accessory is also available.
Contact: Ladislav Fekete / 266052430 / fekete@fzu.cz