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Experimental Facilities in Physics and Material Science & Engineering
Rozcestník experimentálního vybavení pro fyziku a materiálové vědy
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1. Characterisation and Testing
1.1. Surface Characterisation
1.2. Electron Microscopy
1.3. X-ray Facilities
1.4. AFM & SPM
1.5. Spectroscopy
1.6. Physical Property (Bulk)
1.7. Lasers
1.8. Sample Preparation
1.9. Other
2. Materials
& Technologies
2.1. Alloy casting
2.2. Crystal growth
2.3. Nanomaterials
2.4. Semiconductors
2.5. Thin films and coatings
2.6. Materials Processing
2.7. Other
3. Workshops
4. Services
4.1. Computing services
4.2. Research services
4.3. Support services
4.4. Other
5. Software
5.1. CAD Software
5.2. Databases general
5.3. FEM software
5.4. Material databases
5.5. Material science
5.6. Mathematics
5.7. Measurement&control
5.8. Project management
5.9. Simulations general
5.10. Theoretical Physics
5.11. Other
In-Via Reflex Raman Microscope (RENISHAW) combined with NTEGRA Spectra AFM Upright Microscope (NT-MDT)
Optical AFM head – for Raman and AFM mapping (excitation @ 488 or 325 nm)
Category:
Physical Property (Bulk)
Number:
12
Section:
2
Department:
12
Contact person:
I. Gregora
Phone number:
2 6605 2654
E-mail:
gregora@fzu.cz
Room:
Slovanka 128
Website:
inVia Raman microscopes