Rozcestník experimentálního vybavení pro fyziku a materiálové vědy
AFM microscope Dimension 3100
Atomic force microscope with position control and advanced regimes for correlated measurements of high-resolution nanoscale morphology, phase, (opto) electronic properties, and electronic transport.
Category:
Number:
2
Section:
3
Department:
26
Contact person:
Antonin Fejfar
Phone number:
220 318 501
E-mail:
Room:
C205/7
Website: