3D microstructure and microtexture characterisation

Microstructure and microtexture characterisation of bulk materials by the application of FIB sectioning method with electron back-scattered diffraction method using EDAC Digiview V analyzer on Tescan FERA 3 SEM can be used to map the crystal lattice orientation and evaluate consequent quantities (texture, grain size, grain boundary characteristics etc.). The metallographically polished surface or other fresh crystalline surface (deposited layers) is requested. Limited amount of samples can be prepared in the metalography laboratory.