Scanning electron microscopy services

Services using Tescan FERA 3  electron microscope

Both secondary electrons and back-scattered electrons detectors can be used with nominal resolution 2 nm at least. Non-conductive or poorly conductive samples can be observed by beam deceleration mode or low-vacuum microscopy working at nitrogen atmosphere with the pressure up to 500 Pa and resolution i3,5 nm. Particular requests shall be discussed with operators in advance